Ionic densities measurement in an electron cyclotron resonance ion source plasma by high resolution X-ray spectroscopy
Description
Electron cyclotron resonance (ECR) ion sources currently represent the best compromise for the supply of intense beams of highly charged positive ions. Their performances have, over the last few years, constantly evolved. Nevertheless, their improvement requires a better understanding of the mechanisms governing the production and confinement of ions in these machines. The aim of this work was to measure the densities of multi-charged ions in an RCE plasma by X-ray emission spectroscopy. The density distribution obtained could then be compared to the distribution of the currents extracted from the source. For this purpose a high resolution X-ray spectrometer was developed and built. At the same time, a detailed study of the Bremsstrahlung emitted by the plasma electrons allowed the determination of the electronic distribution function. A strong evolution of the high resolution X-ray spectra with the parameters of the ion source was observed. It appeared, moreover, a strong correlation with the extracted currents. This phenomenon could be confirmed by an absolute estimation of the different ion densities in the plasma. They proved to be a faithful image of the extracted currents. The ionic confinement times were estimated and a quasi-linear evolution with the charge appeared whereas a strongly exponential evolution was predicted by the theoretical models. These results constitute the first direct evidence that the commonly accepted theoretical model of ion confinement in an ECR source plasma is not adapted. (O.M.)
Abstract (French)
Les sources d'ions a resonance cyclotronique electronique (RCE) representent actuellement le meilleur compromis pour la fourniture de faisceaux intenses d'ions positifs fortement charges. Leurs performances ont, au cours de ces dernieres annees, constamment evolue. Neanmoins aujourd'hui leur amelioration passe par une meilleure comprehension des mecanismes regissant la production et le confinement des ions dans ces machines. Ce travail avait pour objet de mesurer les densites d'ions multicharges au sein d'un plasma RCE par spectroscopie d'emission X. La distribution des densites obtenue a pu, par la suite, etre compare a la distribution des courants extraits de la source. A cette fin un spectrometre X haute resolution a ete developpe et construit. Dans le meme temps, une etude detaillee du rayonnement de freinage emis par les electrons du plasma a permis la determination de la fonction de distribution electronique. Une forte evolution des spectres X haute resolution avec les parametres de la source d'ions a ete observee. Il est, de plus, apparu une forte correlation avec les courants extraits. Ce phenomene a pu etre confirme par une estimation absolue des differentes densites ioniques au sein du plasma. Elles se sont averees etre une image fidele des courants extraits. Les temps de confinement ioniques ont ete estimes et une evolution quasi-lineaire avec la charge est apparue alors qu'une evolution fortement exponentielle etait prevue par les modeles theoriques. Ces resultats constituent la premiere mise en evidence directe que le modele theorique, communement admis, de confinement des ions au sein d'un plasma de source ECR n'est pas adapte.Files
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Additional details
Additional titles
- Original title (French)
- Mesure des densites ioniques dans un plasma de source d'ions a resonance cyclotronique electronique par spectroscopie X haute resolution
Publishing Information
- Imprint Pagination
- 159 p.
- Report number
- FRCEA-TH--9217
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 52035790
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- BREMSSTRAHLUNG; DISTRIBUTION FUNCTIONS; ECR ION SOURCES; ION BEAMS; ION DENSITY; MULTICHARGED IONS; PLASMA; X-RAY SPECTROSCOPY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; FUNCTIONS; ION SOURCES; IONS; RADIATIONS; SPECTROSCOPY
Optional Information
- Notes
- 81 refs.; Available from the INIS Liaison Officer for France, see the INIS website for current contact and E-mail addresses