Characterization of readout circuitry in a demonstrator chip of depleted CMOS active sensors
Creators
- 1. Physikalisches Institut, Universitaet Bonn (Germany)
Description
Depleted CMOS active sensors (DMAPS) in commercial multi-well CMOS technologies are an attractive detector choice for high-energy particle physics experiments, such as in the ATLAS High Luminosity Large Hadron Collider (HL-LHC). Since charge collection by drift is mandatory for such a harsh radiation environment, the application of high bias voltage to high resistive sensor material is needed. A demonstrator of a DMAPS (LFCPIX) has been fabricated in LFoundry 150 nm CMOS process on a substrate with a resistivity of >2 kΩ.cm. The chip size is 10 mm x 10 mm and the pixel size is 50 μm x 250 μm. ATLAS HL-LHC requires high time resolution of 25 ns and a total ionizing dose (TID) for the outer layers of ATLAS pixel detector is estimated as high as 50 Mrad. Ten flavors of readout circuitry are implemented in LFCPIX to investigate the timing performances and the radiation hardness. In the presentation, the characteristics of each readout flavors measured with electrical test pulses, radioactive sources and 2.5 GeV electron beam are shown.
Additional details
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Muenster 2017 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 52(4)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- 81. Annual meeting of DPG and DPG Spring meeting 2017 of the divisions on hadronic and nuclear physics, radiation and medical physics, particle physics and the working groups on equal opportunities, energy, information, young DPG, physics and disarmament
- Original Conference Title
- 81. Jahrestagung der DPG und DPG-Fruehjahrstagung 2017 der Fachverbaende Physik der Hadronen und Kerne, Strahlen- und Medizinphysik, Teilchenphysik und Arbeitskreise Chancengleichheit, Energie, Industrie und Wirtschaft sowie der Arbeitsgruppen Information, junge DPG, Physik und Abruestung
- Dates
- 27-31 Mar 2017
- Place
- Muenster (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 50000377
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRON DETECTION; GEV RANGE 01-10; INTEGRATED CIRCUITS; MOSFET; PERFORMANCE; PULSES; RADIATION HARDENING; READOUT SYSTEMS; SEMICONDUCTOR DETECTORS; SUBSTRATES; TIMING PROPERTIES
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; ENERGY RANGE; FIELD EFFECT TRANSISTORS; GEV RANGE; HARDENING; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; MOS TRANSISTORS; PHYSICAL PROPERTIES; PHYSICAL RADIATION EFFECTS; RADIATION DETECTION; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; TRANSISTORS
Optional Information
- Notes
- Session: T 94.7 Mi 18:15; No further information available