Published June 1, 2012 | Version v1
Journal article

The design of electroabsorption modulators with negative chirp and very low insertion loss

Creators

  • 1. Department of Electrical Engineering, Faculty of Electrical and Computer Engineering, Shahid Beheshti University, G. C., Evin 1983963113, Tehran (Iran, Islamic Republic of)

Description

Electroabsorption modulators (EAMs) with negative chirp and very low insertion loss are numerically designed with asymmetric intra-step-barrier coupled double strained quantum wells (AICD-SQWs) based on InGaAlAs material. For this purpose, the electroabsorption coefficient is calculated over a range of wells layer strain from compressive (CS) to tensile (TS). The chirp parameter and insertion loss for TE input light polarization are evaluated from the calculated electroabsorption spectra, and their Kramers-Krönig transformed refractive index changes. The results of the numerical simulation show that the best range of left and right wells strain for EAMs based on AICD-SQWs with negative chirp and very low insertion loss are from 0.032% to 0.05% (TS) and −0.52% to −0.50% (CS), respectively. (semiconductor devices)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/33/6/064001

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
33
Journal Issue
6
Journal Page Range
[6 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43107901
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ASYMMETRY; COMPUTERIZED SIMULATION; DESIGN; KRAMERS-KRONIG CORRELATION; LAYERS; POLARIZATION; QUANTUM WELLS; REFRACTIVE INDEX; SEMICONDUCTOR DEVICES; SPECTRA; STRAINS
Descriptors DEC
CORRELATIONS; NANOSTRUCTURES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SIMULATION