The design of electroabsorption modulators with negative chirp and very low insertion loss
Creators
- 1. Department of Electrical Engineering, Faculty of Electrical and Computer Engineering, Shahid Beheshti University, G. C., Evin 1983963113, Tehran (Iran, Islamic Republic of)
Description
Electroabsorption modulators (EAMs) with negative chirp and very low insertion loss are numerically designed with asymmetric intra-step-barrier coupled double strained quantum wells (AICD-SQWs) based on InGaAlAs material. For this purpose, the electroabsorption coefficient is calculated over a range of wells layer strain from compressive (CS) to tensile (TS). The chirp parameter and insertion loss for TE input light polarization are evaluated from the calculated electroabsorption spectra, and their Kramers-Krönig transformed refractive index changes. The results of the numerical simulation show that the best range of left and right wells strain for EAMs based on AICD-SQWs with negative chirp and very low insertion loss are from 0.032% to 0.05% (TS) and −0.52% to −0.50% (CS), respectively. (semiconductor devices)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/33/6/064001Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 33
- Journal Issue
- 6
- Journal Page Range
- [6 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43107901
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ASYMMETRY; COMPUTERIZED SIMULATION; DESIGN; KRAMERS-KRONIG CORRELATION; LAYERS; POLARIZATION; QUANTUM WELLS; REFRACTIVE INDEX; SEMICONDUCTOR DEVICES; SPECTRA; STRAINS
- Descriptors DEC
- CORRELATIONS; NANOSTRUCTURES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SIMULATION