Published August 2009 | Version v1
Journal article Metadata-only

In situ X-ray investigation of lattice strain in SrTiO3/La0.7Sr0.3MnO3 thin films induced by piezoelectric 0.72Pb(Mg1/3Nb2/3)O3-0.28PbTiO3 substrate in an external electric field

Creators

  • 1. Technische Universitaet Dresden, Institut fuer Strukturphysik, Dresden (Germany)
  • 2. Institute for Metallic Materials, IFW Dresden, P.O. Box 270116, Dresden (Germany)

Description

Composite structures consisting of (001)-oriented SrTiO3 (STO)/La0.7Sr0.3MnO3 (LSMO) films of 30 nm thickness, grown on an (001) Pb(Mg1/3Nb2/3)TiO3- 28 mol.% PbTiO3 piezoelectric relaxor-ferroelectric single-crystalline wafer were investigated by means of Wide-Angle X-ray Diffraction (WAXRD) in situ under influence of a d.c. electric field with strength E up to ±18 kV/cm. The WAXRD measurements of the films and substrate reflection profiles resulted in a determination of the strain s in the films and the substrate separately. The strained state of the STO/LSMO films is effectively controlled by a huge converse piezoelectric effect of the PMN-PT substrate. The coefficients of coupling between electric-field-induced out-of-plane strain in the films and in the substrate for the composite system STO/LSMO/PMN-PT are obtained. (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1007/s00339-008-5048-3

Additional details

Identifiers

DOI
10.1007/s00339-008-5048-3;

Publishing Information

Journal Title
Applied Physics. A, Materials Science and Processing
Journal Volume
96
Journal Issue
3
Series
Special Issue: ''Smart Materials''
Journal Page Range
p. 575-580
ISSN
0947-8396
CODEN
APAMFC

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
40081473
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COMPOSITE MATERIALS; ELECTRIC FIELDS; LANTHANUM OXIDES; LATTICE PARAMETERS; LEAD COMPOUNDS; MAGNESIUM OXIDES; MANGANESE OXIDES; MONOCRYSTALS; NIOBATES; PIEZOELECTRICITY; STRAINS; STRONTIUM OXIDES; STRONTIUM TITANATES; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRICITY; FILMS; LANTHANUM COMPOUNDS; MAGNESIUM COMPOUNDS; MANGANESE COMPOUNDS; MATERIALS; NIOBIUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; REFRACTORY METAL COMPOUNDS; SCATTERING; STRONTIUM COMPOUNDS; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS