Published August 1994 | Version v1
Journal article

Characteristics of a 'HARP' signal processor with analog memory operated with segmented silicon detectors

  • 1. CERN, Geneva (Switzerland)
  • 2. Geneva Univ. (Switzerland)

Description

For future particle experiments, the detector systems will have a large number of detecting elements, and these will provide raw data at ∼ 50 MHz rates. As an example, the silicon outer tracker (SIT) for the ATLAS detector may consist of 5 planes of silicon strip and pad detectors with 390,000 independent channels per plane. The signal processing electronics must comply with the strong limitation on electrical power and cooling in the central barrel. A 32 channel analog VLSI detector readout chip (HARP32) with an input charge preamplifier, a 64-cell current integrating analog memory in each channel and a common analog multiplexer, has been used in a test beam with segmented silicon detectors. The device was operated at the LHC clock speed of 66 MHz. The different pedestal variations seen at the output are analyzed: the input noise σn amounts to 2.8mV r.m.s., the pedestal non-uniformity in channel σped to 1.2mV r.m.s., the channel to channel pedestal variation σch to 4.0mV r.m.s., and an output baseline shift σobs of 3.5mV r.m.s. has been observed

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
41
Journal Issue
4Pt1
Journal Page Range
p. 1130-1134.
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
nuclear science symposium and medical imaging conference.
Acronym
NSS-MIC '93
Dates
30 Oct - 6 Nov 1993.
Place
San Francisco, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
26026288
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANALOG SYSTEMS; INTEGRATED CIRCUITS; OPERATION; PERFORMANCE; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS
Descriptors DEC
ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Secondary number(s)
CONF-931051--.