Characteristics of a 'HARP' signal processor with analog memory operated with segmented silicon detectors
Creators
- 1. CERN, Geneva (Switzerland)
- 2. Geneva Univ. (Switzerland)
Description
For future particle experiments, the detector systems will have a large number of detecting elements, and these will provide raw data at ∼ 50 MHz rates. As an example, the silicon outer tracker (SIT) for the ATLAS detector may consist of 5 planes of silicon strip and pad detectors with 390,000 independent channels per plane. The signal processing electronics must comply with the strong limitation on electrical power and cooling in the central barrel. A 32 channel analog VLSI detector readout chip (HARP32) with an input charge preamplifier, a 64-cell current integrating analog memory in each channel and a common analog multiplexer, has been used in a test beam with segmented silicon detectors. The device was operated at the LHC clock speed of 66 MHz. The different pedestal variations seen at the output are analyzed: the input noise σn amounts to 2.8mV r.m.s., the pedestal non-uniformity in channel σped to 1.2mV r.m.s., the channel to channel pedestal variation σch to 4.0mV r.m.s., and an output baseline shift σobs of 3.5mV r.m.s. has been observed
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 41
- Journal Issue
- 4Pt1
- Journal Page Range
- p. 1130-1134.
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- nuclear science symposium and medical imaging conference.
- Acronym
- NSS-MIC '93
- Dates
- 30 Oct - 6 Nov 1993.
- Place
- San Francisco, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 26026288
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANALOG SYSTEMS; INTEGRATED CIRCUITS; OPERATION; PERFORMANCE; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS
Optional Information
- Secondary number(s)
- CONF-931051--.