A Novel Low Frequency Vibration Measurement Method Based on Single Camera
- 1. College of Information Science and Technology, Beijing University of Chemical Technology, No. 15, Bei San Huan Dong Lu, Beijing (China)
- 2. National Institute of Metrology, No.18, Bei San Huan Dong Lu, Beijing (China)
Description
In recent years, low frequency vibration measurement is being widely concerned in many applications, because low frequency vibration usually introduces a strong influence. The low frequency vibration is commonly measured by the laser interferometry, requiring a complicated system and a high cost laser interferometer, and its flexibility in field vibration measurement is poor; or the method using vibration transducer, requiring a transducer with known sensitivity, and its measurement precision is not high. In this paper, we propose a novel method based on single camera, which achieves low frequency vibration measurement via collecting and processing sufficient frame sequence images. The proposed method is compared with the heterodyne interferometry by measuring the vibration displacements of a long-stroke shaker simultaneously. Experimental results show the proposed method realizes <1% vibration displacement measurement precision at frequencies between 0.05 Hz-5 Hz. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1065/22/222016Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1065
- Journal Issue
- 22
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 22. World Congress of the International Measurement Confederation
- Acronym
- IMEKO 2018
- Dates
- 3-6 Sep 2018
- Place
- Belfast (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53016227
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S47: OTHER INSTRUMENTATION;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAMERAS; FLEXIBILITY; INTERFEROMETERS; INTERFEROMETRY; LASERS; SENSITIVITY; TRANSDUCERS
- Descriptors DEC
- MEASURING INSTRUMENTS; MECHANICAL PROPERTIES; TENSILE PROPERTIES