Published August 2008 | Version v1
Journal article

Thick epitaxial Pb(Zr0.35, Ti0.65)O3 films grown on (100)CaF2 substrates with polar-axis-orientation

  • 1. Tokyo Inst. of Technology, Dept. of Innovative and Engineering Materials, Yokohama, Kanagawa (Japan)
  • 2. Bruker AXS, Application Laboratory, Yokohama, Kanagawa (Japan)

Description

(100)/(001)-oriented tetragonal Pb(Zr,Ti)O3(PZT) films, which were thicker than 2 μm, were epitaxially grown on SrRuO3-covered (100)Si, (100)KTaO3, (100)SrTiO3, and (100)CaF2 substrates by metal organic chemical vapor deposition. The volume fraction of the (001)-orientation almost linearly increased as the thermal strain increased during the cooling process from the deposition temperature to the Curie temperature. Consequently, perfectly (001)-oriented, i.e., polar-axis-oriented, thick films were obtained on CaF2 substrates with a remanent polarization of 71 μC/cm2. This approach to grow polar-axis-oriented PZT thick films enabled the intrinsic piezoelectricity of PZT itself to be clarified, and has potential in novel applications. (author)

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Express
Journal Volume
1
Journal Issue
8
Journal Page Range
p. 085001.1-085001.3
ISSN
1882-0778

Optional Information

Notes
15 refs., 5 figs.