Published March 22, 2013 | Version v1
Journal article

Development of near atomically perfect diffraction gratings for EUV and soft x-rays with very high efficiency and resolving power

  • 1. Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States)
  • 2. The Fraunhofer Institute for Material and Beam Technology, Winterbergstraße 28 01277 Dresden (Germany)
  • 3. Saint Petersburg Academic University, 8/3 Khlopina St, St. Petersburg, 194021 (Russian Federation)

Description

Multilayer-coated Blazed Gratings (MBG) can offer high diffraction efficiency in a very high diffraction order and are therefore of great interest for high-resolution EUV and soft x-ray spectroscopy techniques such as Resonance Inelastic X-ray Scattering. However, realization of the MBG concept requires nano-scale precision in fabrication of a saw-tooth substrate with atomically smooth facets, and reproduction of the blazed groove profile in the course of conformal growth of a multilayer coating. We report on recent progress achieved in the development, fabrication, and characterization of ultra-dense MBGs for EUV and soft x-rays. As a result of thorough optimization of all steps of the fabrication process, an absolute diffraction efficiency as high as 44% and 12.7% was achieved for a 5250 l/mm grating in the EUV and soft x-ray regions respectively. This work now shows a direct route to achieving high diffraction efficiency in high order at wavelengths throughout the soft x-ray energy range with revolutionary applications in synchrotron science.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/425/15/152006

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
425
Journal Issue
15
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
11. international conference on synchrotron radiation instrumentation
Acronym
SRI 2012
Dates
9-13 Jul 2012
Place
Lyon (France)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44119508
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; DIFFRACTION GRATINGS; EFFICIENCY; ENERGY RANGE; FABRICATION; LAYERS; OPTIMIZATION; RESOLUTION; RESONANCE; SOFT X RADIATION; SPECTROSCOPY; SYNCHROTRONS; X-RAY DIFFRACTION
Descriptors DEC
ACCELERATORS; COHERENT SCATTERING; CYCLIC ACCELERATORS; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; SCATTERING; X RADIATION