Interface structure and properties of a brass-reinforced Ni59Zr20Ti16Si2Sn3 bulk metallic glass composite
- 1. Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)
- 2. Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996 (United States)
- 3. Department of Metallurgical Engineering, Yonsei University, Seoul 120-749 (Korea, Republic of)
Description
Interfaces between a Ni59Zr20Ti16Si2Sn3 bulk metallic glass (BMG) and crystalline brass reinforcements were characterized using transmission electron microscopy and nanoindentation. An interfacial layer with a thickness of ∼50-100 nm was observed in the composite prepared by warm extrusion of gas atomized powders. Microstructural characterization and chemical analysis suggest that the formation of interfacial layer was caused by interdiffusion between the BMG and brass during the warm extrusion. Nanoindentation in the vicinity of BMG-brass interfaces does not cause interface decohesion or crack formation, suggesting a strong interface bonding. Apparently, the resultant interfacial layer not only enhances interfacial bonding but also provides a buffer zone to prevent the catastrophic shear band propagation in the BMG matrix
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2008.02.047Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2008.02.047;
- PII
- S1359-6454(08)00187-0;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 56
- Journal Issue
- 13
- Journal Page Range
- p. 3077-3087
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40008154
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BRASS; CHEMICAL ANALYSIS; CRACK PROPAGATION; EXTRUSION; INTERFACES; LAYERS; MECHANICAL PROPERTIES; METALLIC GLASSES; MICROSTRUCTURE; NICKEL ALLOYS; SHEAR; SILICON ALLOYS; THICKNESS; TIN ALLOYS; TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; ZIRCONIUM ALLOYS
- Descriptors DEC
- ALLOYS; COPPER ALLOYS; COPPER BASE ALLOYS; DIMENSIONS; ELECTRON MICROSCOPY; FABRICATION; MATERIALS WORKING; MICROSCOPY; TRANSITION ELEMENT ALLOYS; ZINC ALLOYS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.