Metastable oxygen incorporation into thin film NiO by low temperature active oxidation: Influence on hole conduction
- 1. School of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138 (United States)
Description
The ability to controllably tune cation valence state and resulting electrical conductivity of transition metal-oxides such as NiO is of great interest for a range of solid state electronic and energy devices and more recently in understanding electron correlation phenomena at complex oxide interfaces. Here, we demonstrate that it is possible to enhance electrical conductivity of NiO thin films by one order of magnitude by photoexcitation and three orders of magnitude by ozone treatment at as low as 310 K. The change occurs within nearly 2000 s and, thereafter, reaches a self-limiting value. A surprising difference is seen at 400 K: ultraviolet photon and ozone treatments cause only a marginal reduction in resistance in the first few minutes and, then, the resistance begins to increase and recovers its original value. This unusual reversal is explained by considering metastable incorporation of oxygen in NiO and oxygen equilibration with the environment. Variation in nickel valence state prior to and after photoexcitation and ozone treatment, investigated by x-ray photoelectron spectroscopy, provides mechanistic insights into resistance trends. This study demonstrates photon-assisted and ozone oxidation as effective low temperature routes to tune the electrical properties as well as metastably incorporate oxygen into oxides with direct influence on electrical conduction properties.
Additional details
Identifiers
- DOI
- 10.1063/1.3516473;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 108
- Journal Issue
- 11
- Journal Page Range
- p. 113702-113702.6
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43016974
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BEARINGS; DENSITY; ELECTRIC CONDUCTIVITY; ELECTRON CORRELATION; EQUIPMENT; INTERFACES; INVERTEBRATES; LIMITING VALUES; NICKEL OXIDES; OXIDATION; OXYGEN; PHOTOCHEMISTRY; PHOTONS; PHOTORESISTORS; SOLIDS; STRATIGRAPHY; THIN FILMS; TRANSITION ELEMENT COMPOUNDS; ULTRAVIOLET RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ANIMALS; BOSONS; CHALCOGENIDES; CHEMICAL REACTIONS; CHEMISTRY; CORRELATIONS; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; EQUIPMENT; FILMS; GEOLOGY; MASSLESS PARTICLES; NICKEL COMPOUNDS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; RESISTORS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2010 American Institute of Physics