Monte Carlo simulations of slow-positron production from normal and glancing incident targets
Creators
- 1. Idaho Accelerator Center, Idaho State University, 1500 Alvin Ricken Dr., Pocatello, ID 83209-8263 (United States) and Department of Physics, Idaho State University, Pocatello, ID 83209-8106 (United States)
Description
A systematic set of Monte Carlo simulations of slow-positron production by energetic electrons impinging on normal and glancing incident targets are presented. The estimated slow-positron production efficiencies are found to increase linearly with incident electron energy when using converters of optimal thickness. The two targets perform equally well below 20 MeV but at higher energies the glancing incident target is more efficient. This increase in efficiency is caused by a decrease in the converter's positron production volume, allowing a larger fraction of low-energy primary positrons to escape from the converter and impinge on the moderators. Further increases in the glancing incident target's efficiency may be possible by altering the arrangement of the converter-moderator system
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.11.005;
- PII
- S0168-583X(05)01899-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 245
- Journal Issue
- 2
- Journal Page Range
- p. 355-362
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37069776
- Subject category
- S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- COMPUTERIZED SIMULATION; EFFICIENCY; MEV RANGE 10-100; MODERATORS; MONTE CARLO METHOD; POSITRON BEAMS; POSITRONS; TAIL ELECTRONS; THICKNESS
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BEAMS; CALCULATION METHODS; DIMENSIONS; ELECTRONS; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; LEPTON BEAMS; LEPTONS; MATTER; MEV RANGE; PARTICLE BEAMS; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.