Published 1996
| Version v1
Miscellaneous
Multiple and double scattering contributions to depth resolution and low energy background in hydrogen elastic recoil detection
Creators
- 1. Commonwealth Scientific and Industrial Research Organisation (CSIRO), Lindfield, NSW (Australia). Div. of Applied Physics
Description
The sensitivity of hydrogen elastic recoil detection ( ERD ) is usually limited by the low energy background in the ERD spectrum. A number of 4.5 MeV He++ hydrogen ERD spectra from different hydrogen implanted samples are compared. The samples are chosen with different atomic numbers from low Z (carbon) to high Z (tungsten carbide) to observe the effects of multiple scattering and double scattering within the sample material. The experimental depth resolution and levels of the low energy background in ERD spectra are compared with theoretical predictions from multiple and double scattering. 10 refs., 2 tabs., 5 figs
Additional details
Publishing Information
- Imprint Place
- Lucas Heights (Australia)
- Imprint Title
- 9th Australian conference on nuclear techniques of analysis. Proceedings
- Imprint Pagination
- 186 p.
- Journal Page Range
- p. 35-37.
- Report number
- INIS-AU--0003
Conference
- Title
- 9. Australian conference on nuclear techniques of analysis.
- Dates
- 27-29 Nov 1995.
- Place
- Newcastle, NSW (Australia).
INIS
- Country of Publication
- Australia
- Country of Input or Organization
- Australia
- INIS RN
- 28058226
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CARBIDES; CARBON; COMPUTERIZED SIMULATION; ENERGY SPECTRA; EXPERIMENTAL DATA; GERMANIUM; HELIUM IONS; HYDROGEN; ION IMPLANTATION; ION SCATTERING ANALYSIS; KEV RANGE 01-10; MULTIPLE SCATTERING; RECOILS; SILICON; SPATIAL RESOLUTION; T CODES; THEORETICAL DATA
- Descriptors DEC
- CARBON COMPOUNDS; CHARGED PARTICLES; CHEMICAL ANALYSIS; COMPUTER CODES; DATA; ELEMENTS; ENERGY RANGE; INFORMATION; IONS; KEV RANGE; METALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUMERICAL DATA; RESOLUTION; SCATTERING; SEMIMETALS; SIMULATION; SPECTRA