Published August 1, 2004 | Version v1
Journal article

Consideration on the BPM alignment tolerance in X-ray FELs

Description

The effects of the trajectory error on the FEL amplification process are studied analytically and numerically in order to estimate the alignment tolerance of the beam position monitor (BPM) installed in the undulator line of the SASE-based FEL. Analytical investigations show that an angle error on the electron beam disturbs the FEL amplification process by two mechanisms: one is a decrease in radiation efficiency, and the other is smearing of microbunch. Simple formulae to denote these two effects are derived, and a critical angle is introduced as a criterion for the single kick error to be allowed. Then, numerical simulations are performed to estimate the tolerance of the BPM alignment to be required practically. These are in good agreement with the results of the analytical investigations

Additional details

Identifiers

DOI
10.1016/j.nima.2004.04.040;
PII
S0168900204006941;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
528
Journal Issue
1-2
Journal Page Range
p. 172-178
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
25. international free electron laser conference; 10. FEL users workshop
Dates
8-12 Sep 2003
Place
Tsukuba, Ibaraki (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36018790
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM MONITORS; BEAM POSITION; COMPUTERIZED SIMULATION; EFFICIENCY; ELECTRON BEAMS; ERRORS; FREE ELECTRON LASERS; GAIN; TOLERANCE; TRAJECTORIES; X RADIATION
Descriptors DEC
AMPLIFICATION; BEAMS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LASERS; LEPTON BEAMS; MEASURING INSTRUMENTS; MONITORS; PARTICLE BEAMS; RADIATIONS; SIMULATION

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.