Review of new methods of texture measurements on a base of author's experimental results
Description
A critical review is presented of the author's investigations on applications of new methods in texture measurement and in the analysis of the influence of texture on the property of materials. The application of traditional neutron diffraction technique, time-of-flight technique and energy-dispersive X-ray diffraction technique is proposed. The neutron diffraction method was used in examining the texture in coarse-grained materials, in materials with a low degree of texture development and in measurements of materials showing non-homogeneous and porous structure. The new possibility of neutron diffraction technique was also investigated when examining the mean texture in materials. The reasons for rolling texture inhomogeneity are discussed, and a computer model is presented of the formation of texture changes in rolled materials. In the following part of the work, neutron diffraction results were applied in quantitative studies of correlation between texture and the anisotropy of the elastic, plastic and magnetic properties. The next part of paper presents the application of the neutron time-of flight method and the energy dispersive X-ray diffraction in the determination of inverse pole figures and simultaneous measurements of several pole figures. Finally the analysis of errors in texture measurements carried out by means of the new methods of texture examination are presented, and the possibilities of future application are discussed. (author)
Additional details
Additional titles
- Original title (Polish)
- Analiza wxpolczesnych metod pomiaru tekstury na podstawie wynikow wlasnych badan
Publishing Information
- Journal Title
- Zesz. Nauk. Akad. Gorn.-Hutn. Stanisl. Staszica, Mat., Fiz., Chem.
- Journal Issue
- no.703
- Series
- Zesz. Nauk. Akad. Gorn.-Hutn. Stanisl. Staszica, Mat., Fiz., Chem.
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 11563362
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ANISOTROPY; ELASTICITY; EXPERIMENTAL DATA; GRAIN ORIENTATION; GRAPHITE; GRAPHS; ISOLATED VALUES; MAGNETIC PROPERTIES; METALS; NEUTRON DIFFRACTION; PLASTICITY; ROLLING; SHEETS; TABLES; TEXTURE; TIME-OF-FLIGHT METHOD; X-RAY DIFFRACTION
- Descriptors DEC
- CARBON; COHERENT SCATTERING; CRYSTAL STRUCTURE; DATA; DATA FORMS; DIFFRACTION; ELEMENTS; FABRICATION; INFORMATION; MATERIALS WORKING; MECHANICAL PROPERTIES; MICROSTRUCTURE; NONMETALS; NUMERICAL DATA; ORIENTATION; PHYSICAL PROPERTIES; SCATTERING
Optional Information
- Notes
- 66 refs.