A second-order focusing electrostatic toroidal electron spectrometer with 2π radian collection
Creators
- 1. Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore)
Description
This paper presents a toroidal electron energy spectrometer designed to capture electrons in the full 2π azimuthal angular direction while at the same time having second-order focusing optics. Simulation results based upon direct ray tracing predict that the relative energy resolution of the spectrometer will be 0.146% and 0.0188% at input angular spreads of ±6 deg. and ±3 deg., respectively, comparable to the theoretically best resolution of the cylindrical mirror analyzer (CMA), and an order of magnitude better than existing toroidal spectrometers. Also predicted for the spectrometer is a parallel energy acquisition mode of operation, where the energy bandwidth is expected to be >±10% (20% total) of the pass energy. The spectrometer is designed to allow for retardation of the pass energy without the need to incorporate auxiliary lenses.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2008.09.001Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2008.09.001;
- PII
- S0304-3991(08)00231-3;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 109
- Journal Issue
- 1
- Journal Page Range
- p. 104-110
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41009598
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; CYLINDRICAL CONFIGURATION; ELECTRON SPECTROMETERS; ELECTRONS; ENERGY RESOLUTION; FOCUSING; LENSES; MIRRORS; OPERATION; OPTICS; SCANNING ELECTRON MICROSCOPY; SIMULATION
- Descriptors DEC
- CONFIGURATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MEASURING INSTRUMENTS; MICROSCOPY; RESOLUTION; SPECTROMETERS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.