Published July 2, 2012 | Version v1
Journal article

Direct Measurement of the Crystallographically Sensitive Atomic Termination of Nanophase Cerium Dioxide

  • 1. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom)
  • 2. School of Materials, University of Manchester, Grosvenor Street, M1 7HS (United Kingdom)
  • 3. JEOL Ltd. 1-2 Mushasino 3-Chome, Akishima, Tokyo 196 (Japan)
  • 4. Department of Physics, Tokyo Institute of Technology, 2-12-1-H-51 Oh-okayam, Meguro-ku, Tokyo 152, and CREST, Kawaguchi, Saitama 332-0012 (Japan)

Description

Aberration-corrected high-resolution transmission electron microscopy (HRTEM) was used to study the surface termination of nanophase cerium dioxide particles. Application of computational exit-wave restoration and comparison with simulations confirmed the {111} surfaces to have an oxygen termination, and while structurally unstable at room temperature the {100} facets exhibited a metal terminating plane. This crystallographically sensitive atomic termination was found to be maintained under the reducing conditions of the electron beam. During electron beam irradiation, Electron Energy Loss Spectroscopy (EELS) analysis revealed that a change from Ce4+ to Ce3+ originates at the particle surface, and gradually extends into the particle as reduction continues. The results aid understanding of the oxygen buffering mechanism in cerium dioxide, and provide valuable insight into the use of CeO2 nanoparticles in catalysis.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/371/1/012072

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
371
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
Electron microscopy and analysis group conference 2011
Acronym
EMAG 2011
Dates
6-9 Sep 2011
Place
Birmingham (United Kingdom)