Structure of ceramic surfaces modified by ion-beam techniques
Description
A wide variety of structures are produced by ion implantation in ceramics. Random (substitutional and interstitial site occupancy) solid solutions with concentrations of solute that exceed the solubility limit can be produced in Al2O3. The changes that occur during annealing are complex and sometimes unpredictable. Silicon carbide becomes amorphous in a manner analogous to Si for ion fluences that produce more than 0.2 dpa damage. Light (N) and heavy (Cr) ions produce similar results if the fluence is scaled to damage energy deposited. Because of mass differences in the ions, two damage regions are developed in TiB2. The structure remains crystalline to very high damage levels. These structural alterations cause changes in the surface mechanical properties. Since virtually any chemical species can be implanted, one can independently control structural damage and chemical effects. When coupled with selective annealing, this technique has the potential for producing a wide range of surface structures and properties. 8 figures
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE83003484.Files
14749451.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 13 p.
- Report number
- CONF-821133--1
Conference
- Title
- Conference on ceramic science - emergent process methods for high technology ceramics.
- Dates
- 8 - 10 Nov 1982.
- Place
- Raleigh, NC (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 14749451
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; CHROMIUM IONS; HELIUM IONS; ION BEAMS; ION IMPLANTATION; MONOCRYSTALS; PHYSICAL RADIATION EFFECTS; POLYCRYSTALS; RUTHERFORD SCATTERING; SILICON CARBIDES; TITANIUM BORIDES; TITANIUM IONS; TRANSMISSION ELECTRON MICROSCO; ZIRCONIUM IONS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; ATOMIC IONS; BEAMS; BORIDES; BORON COMPOUNDS; CARBIDES; CARBON COMPOUNDS; CHALCOGENIDES; CHARGED PARTICLES; CRYSTALS; ELASTIC SCATTERING; ELECTRON MICROSCOPY; IONS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; RADIATION EFFECTS; SCATTERING; SILICON COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS