Published April 18, 2018 | Version v1
Journal article

CMOS-compatible batch processing of monolayer MoS2 MOSFETs

  • 1. Lehigh University, Bethlehem, PA 18015 (United States)
  • 2. Department of Energy Science, Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon 16419 (Korea, Republic of)
  • 3. IHP, Im Technologiepark 25, 15236 Frankfurt (Oder) (Germany)

Description

Thousands of high-performance 2D metal-oxide-semiconductor field effect transistors (MOSFETs) were fabricated on wafer-scale chemical vapor deposited MoS2 with fully-CMOS-compatible processes such as photolithography and aluminum metallurgy. The yield was greater than 50% in terms of effective gate control with less-than-10 V threshold voltage, even for MOSFETs having deep-submicron gate length. The large number of fabricated MOSFETs allowed statistics to be gathered and the main yield limiter to be attributed to the weak adhesion between the transferred MoS2 and the substrate. With cut-off frequencies approaching the gigahertz range, the performances of the MOSFETs were comparable to that of state-of-the-art MoS2 MOSFETs, whether the MoS2 was grown by a thin-film process or exfoliated from a bulk crystal. (letter)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6463/aab4ba

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
51
Journal Issue
15
Journal Page Range
[6 p.]
ISSN
0022-3727
CODEN
JPAPBE