Published May 1, 1976
| Version v1
Journal article
Chemical bonding and high T/sub c/ in ''Nb3Ge'' sputtered films
Creators
- 1. Materials Research Laboratory, Pennsylvania State University, University Park, Pennsylvania 16802
Description
Soft x-ray L-emission spectra for Nb and Ge in a series of single-phase ''Nb3Ge'' sputtered films of known composition have been obtained. Correlations are shown to exist between T/sub c/ and the nature of the bonding as evidenced by shifts in the emission peaks of characteristic x rays. The Nb and Ge L-emission peaks shift toward lower energies with decreasing lattice parameter and Nb/Ge ratio (and increasing T/sub c/)
Additional details
Identifiers
- DOI
- 10.1063/1.88822;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 28
- Journal Issue
- 9
- Series
- Appl. Phys. Lett.
- Journal Page Range
- 557-559
- ISSN
- 0003-6951
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 7259810
- Subject category
- S36: MATERIALS SCIENCE; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- EMISSION SPECTRA; FILMS; GERMANIUM ALLOYS; LATTICE PARAMETERS; NIOBIUM BASE ALLOYS; SOFT X RADIATION; SPUTTERING; SUPERCONDUCTIVITY; SUPERCONDUCTORS; TRANSITION TEMPERATURE; X-RAY SPECTRA
- Descriptors DEC
- ALLOYS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; NIOBIUM ALLOYS; PHYSICAL PROPERTIES; RADIATIONS; SPECTRA; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT ALLOYS; X RADIATION
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent