Published May 21, 2005 | Version v1
Journal article

Production of a high brightness beam from a large surface source

  • 1. Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Bidg 47R0112, Berkeley, CA 94720-8139 (United States)
  • 2. Lawrence Livermore National Laboratory (United States)
  • 3. University of Maryland (United States)

Description

An experiment was set up on a 500-kV test stand to study the beam optics of an extraction diode using a 10-cm diameter alumino-silicate source. The beam was also sent through an aperture to reduce aberrations, thus enhancing its brightness. In comparing the experimental results with WARP-3D computer simulations, we found excellent agreement in the emittance diagrams and in the beam current rise-time. By benchmarking the computer code, we now have the capability to perform detail optical designs and to create the proper voltage waveform for producing a current pulse with a fast rise-time. A fast rise-time pulse is desirable because many potential near-term HIF experiments will require short beam pulses which have a fast rise-time

Additional details

Identifiers

DOI
10.1016/j.nima.2005.01.273;
PII
S0168-9002(05)00384-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
544
Journal Issue
1-2
Journal Page Range
p. 430-435
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
15. international symposium on heavy ion inertial fusion
Acronym
HIF 2004
Dates
7-11 Jun 2004
Place
Princeton, NJ (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37033832
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
APERTURES; BEAM CURRENTS; BEAM OPTICS; BEAM PULSERS; BEAMS; BRIGHTNESS; COMPUTER CODES; COMPUTERIZED SIMULATION; DESIGN; DIAGRAMS; ION SOURCES; IONS; PULSE RISE TIME; PULSES; SILICATES; SURFACES; WAVE FORMS
Descriptors DEC
CHARGED PARTICLES; CURRENTS; INFORMATION; OPENINGS; OPTICAL PROPERTIES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SILICON COMPOUNDS; SIMULATION; TIMING PROPERTIES

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.