Published 1984 | Version v1
Journal article Metadata-only

Performance of multilayer dispersion elements from 80 to 500 eV

Creators

  • 1. Los Alamos National Lab., NM

Description

The authors have measured the reflectivity of several multilayer dispersion elements between 80 and 500 eV. Two samples of ReW-C and one of Ni-C with 2d spacing of approximately 70 A and 150 A were tested at angles of incidence between 100 and 800. Measurements were made by fixing the incident and reflected angles (Bragg) and scanning the photon energy. Theoretical analyses of these multilayers have also been made and the results are compared with the experimental measurements. 4 references, 1 figure, 1 table

Additional details

Publishing Information

Journal Title
Proc. Soc. Photo-Opt. Instrum. Eng.
Journal Volume
447
Series
Proc. Soc. Photo-Opt. Instrum. Eng.
Journal Page Range
23-26
ISSN
0361-0748
CODEN
SPIEC

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
18060042
Subject category
S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ANGULAR DISTRIBUTION; CARBON; ENERGY DEPENDENCE; LAYERS; NICKEL; OPTICAL DISPERSION; OPTICAL SYSTEMS; REFLECTION; SOFT X RADIATION; TUNGSTEN
Descriptors DEC
DISTRIBUTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; NONMETALS; RADIATIONS; TRANSITION ELEMENTS; X RADIATION