A new level-shifting structure with multiply metal rings by divided RESURF technique
Creators
- 1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)
Description
A new structure of a lateral n-MOST and a new level-shifting structure with multiply metal rings (MMRs) by divided RESURF technique have been proposed. The device and electrical performances of the structure are analyzed and simulated by MEDICI. In comparison to the level-shifting structure with multiply floating field plates (MFFPs) used before, the structure stated here improves the reliability and diminishes the voltage difference between the voltage of the power supply of the high-side gate driver and the voltage of the output terminal of the level-shifting structure, which is also that of the input terminal of the high-side gate driver. The maximal voltage difference of the level-shifting structure in this paper is 30% lower than that used before. Therefore, good voltage isolation and current isolation are obtained. The structure can be used in the level-shifting circuit of various applications.
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/30/4/044005Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 30
- Journal Issue
- 4
- Journal Page Range
- [5 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41079203
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPUTERIZED SIMULATION; EQUIPMENT; METALS; RELIABILITY; SEMICONDUCTOR MATERIALS
- Descriptors DEC
- ELEMENTS; MATERIALS; SIMULATION