Published April 2009 | Version v1
Journal article

A new level-shifting structure with multiply metal rings by divided RESURF technique

  • 1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)

Description

A new structure of a lateral n-MOST and a new level-shifting structure with multiply metal rings (MMRs) by divided RESURF technique have been proposed. The device and electrical performances of the structure are analyzed and simulated by MEDICI. In comparison to the level-shifting structure with multiply floating field plates (MFFPs) used before, the structure stated here improves the reliability and diminishes the voltage difference between the voltage of the power supply of the high-side gate driver and the voltage of the output terminal of the level-shifting structure, which is also that of the input terminal of the high-side gate driver. The maximal voltage difference of the level-shifting structure in this paper is 30% lower than that used before. Therefore, good voltage isolation and current isolation are obtained. The structure can be used in the level-shifting circuit of various applications.

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/30/4/044005

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
30
Journal Issue
4
Journal Page Range
[5 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41079203
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COMPUTERIZED SIMULATION; EQUIPMENT; METALS; RELIABILITY; SEMICONDUCTOR MATERIALS
Descriptors DEC
ELEMENTS; MATERIALS; SIMULATION