Published March 2001 | Version v1
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A high-sensitivity, non-destructive trace element analysis

Creators

  • 1. Japan Atomic Energy Research Inst., Tokai, Ibaraki (Japan). Tokai Research Establishment

Description

We have developed a new method of trace element analysis based on neutron activation analysis with multiple γ-ray detection (NAAMG). So far we utilized neutrons from research reactors but the new pulsed neutrons of Advanced Neutron Sources in JAERI and KEK collaboration will open new possibilities of NAAMG. An in-beam measurement will make it possible to identify short-lived activities so that the number of elements of simultaneous analysis becomes as many as 70. The micro beam of neutrons will be useful for the analysis of microscopic structures of various specimen. (author)

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Part of:
Proceedings of the fifteenth meeting of the international collaboration on advanced neutron sources (ICANS-XV). Advanced neutron sources towards the next century

Additional details

Publishing Information

Imprint Title
Proceedings of the fifteenth meeting of the international collaboration on advanced neutron sources (ICANS-XV). Advanced neutron sources towards the next century
Imprint Pagination
1451 p.
Journal Page Range
v. 1 p. 532-534
Report number
JAERI-Conf--2001-002

Conference

Title
15. meeting of the international collaboration on advanced neutron sources
Acronym
ICANS-XV
Dates
6-9 Nov 2000
Place
Tsukuba, Ibaraki (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
33010029
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COINCIDENCE METHODS; ELEMENTS; ENERGY RESOLUTION; GAMMA DETECTION; IN-BEAM SPECTROSCOPY; NEUTRON ACTIVATION ANALYSIS; NONDESTRUCTIVE ANALYSIS; PULSED NEUTRON TECHNIQUES; RADIOISOTOPES; TRACE AMOUNTS
Descriptors DEC
ACTIVATION ANALYSIS; CHEMICAL ANALYSIS; COUNTING TECHNIQUES; DETECTION; ISOTOPES; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; RESOLUTION; SPECTROSCOPY

Optional Information

Notes
4 refs., 1 tab. Imprint:Published in 2 volumes
Secondary number(s)
KEK-PROC--2000-22