Generation of dielectric barrier discharge in high-pressure N2 and CO2 environments up to supercritical conditions
- 1. Department of Advanced Materials Science, Graduate School of Frontier Sciences, Universityof Tokyo, 5-1-5 Kashiwanoha, Kashiwa-shi, Chiba 277-8561 (Japan)
Description
The generations of dielectric barrier discharge (DBD) in high-pressure nitrogen and carbon dioxide environments up to supercritical conditions with or without flow fields were performed. From the second positive system of nitrogen, the rotational temperature of N2 was estimated to be approximately 400 K under a supercritical N2 condition (4 MPa and 313 K). On the other hand, from emission spectra of DBD in a high-pressure CO2 environment (1-8 MPa), C2 and O spectra were remarkable in intensity instead of CO, CO+, CO2 and CO2+ spectra that were remarkable at atmospheric pressure. Furthermore, porous carbon film synthesis by DBD under a supercritical CO2 condition (7.5 MPa and 305 K) was also identified by scanning electron microscopy observation
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.08.101;
- PII
- S0040-6090(05)01305-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 506-507
- Journal Page Range
- p. 409-413
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Joint meeting of 7. APCPST (Asia Pacific conference on plasma science and technology) and 17. SPSM (symposium on plasma science for materials)
- Dates
- 29 Jun - 2 Jul 2004
- Place
- Fukuoka (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38004632
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATMOSPHERIC PRESSURE; CARBON; CARBON DIOXIDE; CARBON MONOXIDE; EMISSION SPECTRA; FILMS; FLUIDS; NITROGEN; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SYNTHESIS; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- CARBON COMPOUNDS; CARBON OXIDES; CHALCOGENIDES; ELECTRON MICROSCOPY; ELEMENTS; MATERIALS; MICROSCOPY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SPECTRA; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.