Published May 26, 2006 | Version v1
Journal article

Generation of dielectric barrier discharge in high-pressure N2 and CO2 environments up to supercritical conditions

  • 1. Department of Advanced Materials Science, Graduate School of Frontier Sciences, Universityof Tokyo, 5-1-5 Kashiwanoha, Kashiwa-shi, Chiba 277-8561 (Japan)

Description

The generations of dielectric barrier discharge (DBD) in high-pressure nitrogen and carbon dioxide environments up to supercritical conditions with or without flow fields were performed. From the second positive system of nitrogen, the rotational temperature of N2 was estimated to be approximately 400 K under a supercritical N2 condition (4 MPa and 313 K). On the other hand, from emission spectra of DBD in a high-pressure CO2 environment (1-8 MPa), C2 and O spectra were remarkable in intensity instead of CO, CO+, CO2 and CO2+ spectra that were remarkable at atmospheric pressure. Furthermore, porous carbon film synthesis by DBD under a supercritical CO2 condition (7.5 MPa and 305 K) was also identified by scanning electron microscopy observation

Additional details

Identifiers

DOI
10.1016/j.tsf.2005.08.101;
PII
S0040-6090(05)01305-2;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
506-507
Journal Page Range
p. 409-413
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Joint meeting of 7. APCPST (Asia Pacific conference on plasma science and technology) and 17. SPSM (symposium on plasma science for materials)
Dates
29 Jun - 2 Jul 2004
Place
Fukuoka (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38004632
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATMOSPHERIC PRESSURE; CARBON; CARBON DIOXIDE; CARBON MONOXIDE; EMISSION SPECTRA; FILMS; FLUIDS; NITROGEN; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SYNTHESIS; TEMPERATURE RANGE 0273-0400 K
Descriptors DEC
CARBON COMPOUNDS; CARBON OXIDES; CHALCOGENIDES; ELECTRON MICROSCOPY; ELEMENTS; MATERIALS; MICROSCOPY; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SPECTRA; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.