Published June 11, 2008 | Version v1
Journal article

Investigation of pixelated TlBr gamma-ray spectrometers with the depth-sensing technique

  • 1. Department of Electronics and Intelligent Systems, Tohoku Institute of Technology, Sendai 982-8577 (Japan)
  • 2. Department of Nuclear Engineering and Radiological Sciences, The University of Michighan, Ann Arbor, MI 48109-2104 (United States)

Description

Pixelated thallium bromide (TlBr) detectors with a thickness of 4.2 mm have been fabricated and investigated with the depth-sensing technique. The energy resolution of the device was improved from 1.95% FWHM to 1.25% FWHM at 662 keV by implementation of the depth correction. The device exhibited an energy resolution of 1.03% FWHM at 662 keV by selecting gamma-ray interaction events occurring underneath the cathode

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2008.03.086

Additional details

Identifiers

DOI
10.1016/j.nima.2008.03.086;
PII
S0168-9002(08)00456-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
591
Journal Issue
1
Journal Page Range
p. 276-278
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
9. international workshop on radiation imaging detectors
Dates
22-26 Jul 2007
Place
Erlangen (Germany)

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.