Synthesis and characterization of Co/cenosphere core-shell structure composites
Creators
- 1. School of Materials Science and Engineering, Jiangsu University, Zhenjiang 212013 (China)
Description
The cobalt film was successfully coated on the cenosphere particles using heterogeneous precipitation thermal reduction method. The morphology and microstructure of the products were analyzed by field emission scanning electron microscopy (FE-SEM) and X-ray diffraction (XRD). FE-SEM results implied that the Co film was relatively uniform and compact. XRD results indicated that the Co film coated on cenospheres was a face-centered cubic structure (fcc) and the crystallite size of Co particles was about 24.5 nm. The magnetic property of Co/cenosphere composites was measured by vibrating sample magnetometer (VSM), and the results showed that the Co/cenosphere composites were of the weak soft magnetic property at room temperature, the Ms and Hc value was 18.2 Am2 kg-1 and 28.4 kA m-1, respectively.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2011.10.108Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2011.10.108;
- PII
- S0169-4332(11)01677-1;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 258
- Journal Issue
- 7
- Journal Page Range
- p. 2627-2631
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44031143
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COBALT; COMPOSITE MATERIALS; FCC LATTICES; FIELD EMISSION; FILMS; GRAIN SIZE; LAYERS; MAGNETIC PROPERTIES; PRECIPITATION; REAGENTS; SCANNING ELECTRON MICROSCOPY; SYNTHESIS; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; MAGNETOMETERS; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; MICROSTRUCTURE; PHYSICAL PROPERTIES; SCATTERING; SEPARATION PROCESSES; SIZE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.