Published 2004 | Version v1
Miscellaneous

Digital radiography: a quantitative approach

Creators

  • 1. Universite de Technologie de Troyes, Troyes (France)

Description

'Full-text:' In a radiograph the value of each pixel is related to the material thickness crossed by the x-rays. Using this relationship, an object can be characterized by parameters such as depth, surface and volume. Assuming a locally linear detector response and using a radiograph of reference object, the quantitative thickness map of object can be obtained by applying offset and gain corrections. However, for an acquisition system composed of cooled CCD camera optically coupled to a scintillator screen, the radiographic image formation process generates some bias which prevent from obtaining the quantitative information: non uniformity of the x-ray source, beam hardening, Compton scattering, scintillator screen, optical system response. In a first section, we propose a complete model of the radiographic image formation process taking account of these biases. In a second section, we present an inversion scheme of this model for a single material object, which enables to obtain the thickness map of the object crossed by the x-rays. (author)

Part of:
Sixteenth world conference on nondestructive testing. Proceedings

Additional details

Publishing Information

Publisher
Canadian Institute for NDE
Imprint Place
Hamilton, Ontario (Canada)
Imprint Title
Sixteenth world conference on nondestructive testing. Proceedings
Imprint Pagination
379 Megabytes
Journal Page Range
[1 p.]

Conference

Title
16. World conference on nondestructive testing
Dates
30 Aug - 3 Sep 2004
Place
Montreal, Quebec (Canada)

INIS

Country of Publication
Canada
Country of Input or Organization
Canada
INIS RN
37043854
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
DEPTH; IMAGE PROCESSING; INDUSTRIAL RADIOGRAPHY; SIMULATION; SURFACES; X-RAY RADIOGRAPHY
Descriptors DEC
DIMENSIONS; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; NONDESTRUCTIVE TESTING; PROCESSING; TESTING

Optional Information

Notes
Short communication. Available in abstract form only, full text entered in this record.