Reconstruction of complex permittivity in HTSC from electron and optical spectroscopy data

New method on determining complex dielectric permittivity ε*(ω), based on combined analysis of the spectrum of characteristic electron energy losses and optical reflection spectrum of the material under study is proposed. The given method is characterized by certain advantages as compared to the Kramers-Cronning method and ellipsometry (the Drude method) generally applied for ε*(ω) reduction. The above method is tested on the Au films and is utilized for calculating dielectric permittivity of the Bi2Sr2Ca1Cu2O8+x monocrystals. 7 refs.; 4 figs