Published December 2010
| Version v1
Journal article
Advanced nano-interface characterization using synchrotron radiation and its application
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Feramu
- Journal Volume
- 15
- Journal Issue
- 12
- Journal Page Range
- p. 814-818
- ISSN
- 1341-688X
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 42106725
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ALUMINIUM OXIDES; COPPER OXIDES; ENERGY RESOLUTION; HAFNIUM OXIDES; LANTHANUM OXIDES; NANOSTRUCTURES; PHOTOELECTRON SPECTROSCOPY; PLATINUM; SILICON OXIDES; SPATIAL RESOLUTION; SYNCHROTRON RADIATION; TIME RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BREMSSTRAHLUNG; CHALCOGENIDES; COPPER COMPOUNDS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; HAFNIUM COMPOUNDS; LANTHANUM COMPOUNDS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PLATINUM METALS; RADIATIONS; RARE EARTH COMPOUNDS; REFRACTORY METAL COMPOUNDS; RESOLUTION; SILICON COMPOUNDS; SPECTROSCOPY; TIMING PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- 16 refs., 6 figs.