Measurement of the electron density in Transient Spark discharge
- 1. Division of Environmental Physics, Faculty of Mathematics, Physics and Informatics, Comenius University, Mlynska dolina F2, 84248 Bratislava (Slovakia)
Description
This paper presents our measurements of the electron density in a streamer-to-spark transition discharge, which is named transient spark (TS), in atmospheric pressure air. Despite the dc applied voltage, TS has a pulsed character with short (∼10–100 ns) high current (>1 A) pulses, with a repetition frequency on the order of kHz. The electron density ne ∼ 1017 cm−3 at maximum is reached in TS with repetition frequencies below ∼3 kHz, using relatively low power delivered to the plasma (0.2–3 W). The temporal evolution of ne was estimated from the resistance of the plasma discharge, which was obtained by a detailed analysis of the electric circuit representing the TS and the discharge diameter measurements using a fast intensified charge-coupled device (iCCD) camera. This estimate was compared with ne calculated from the measured Stark broadening of several atomic lines: Hα, N at 746 nm, and O triplet at 777 nm. Good agreement was obtained, although the method based on the plasma resistance is sensitive to an accurate determination of the discharge diameter. We have found that this method is also limited for strongly ionized plasmas. On the other hand, a lower ne detection limit can be obtained by this method than from the Stark broadening of atomic lines. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0963-0252/23/6/065016Additional details
Identifiers
Publishing Information
- Journal Title
- Plasma Sources Science and Technology
- Journal Volume
- 23
- Journal Issue
- 6
- Journal Page Range
- [12 p.]
- ISSN
- 0963-0252
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46068284
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ATMOSPHERIC PRESSURE; CAMERAS; CHARGE-COUPLED DEVICES; COMPARATIVE EVALUATIONS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; ELECTRON DENSITY; KHZ RANGE; PLASMA; TRANSIENTS; TRIPLETS
- Descriptors DEC
- CURRENTS; EVALUATION; FREQUENCY RANGE; MULTIPLETS; SEMICONDUCTOR DEVICES