Enhanced photocatalytic performance: a β-Bi2O3 thin film by nanoporous surface
Creators
- 1. College of Materials Science and Engineering, Sichuan University, Chengdu (China)
Description
Beta-Bi2O3 film photoanodes with different surface structures were prepared by oxidizing bismuth films. The physical properties were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM), UV-visible absorbance spectra and atomic force microscopy (AFM). XRD shows that all films are beta phase crystal structure except the thinnest 12 nm film. SEM and AFM characterizations indicate that a nanoporous surface structure is generated on the surface after the film is annealed for 3 h, while the films annealed for 1 h show a dense surface. The direct band gaps vary from 2.63 to 2.88 eV, with the film thickness decreasing from 500 to 12 nm. The nanoporous surface structure film exhibits better light harvesting ability and incident photon-to-electron conversion efficiency (IPCE) than the dense surface films. The IPCE (61% at 350 nm and 43% at 400 nm, 0.197 VNHE) is the highest ever reported. The photocurrent density reaches 0.45 mA cm-2 when illuminated with a bias of 1.23 VNHE in 0.5M Na2SO3.
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/46/3/035103Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 46
- Journal Issue
- 3
- Journal Page Range
- [6 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44040395
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; BISMUTH OXIDES; CONVERSION; CRYSTAL STRUCTURE; DENSITY; EFFICIENCY; PERFORMANCE; PHOTOANODES; PHOTOCATALYSIS; SCANNING ELECTRON MICROSCOPY; SPECTRA; THICKNESS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ANODES; BISMUTH COMPOUNDS; CATALYSIS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTRODES; ELECTRON MICROSCOPY; FILMS; HEAT TREATMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING