Published October 2011
| Version v1
Journal article
Effect of pressure and temperature on electronic structure of GaN in the zinc-blende structure
Creators
- 1. Mansoura University, Department of Physics, Faculty of Science (Egypt)
Description
The effect of the hydrostatic pressure and the temperature on the electronic structure in GaN semiconductor has been calculated using the local empirical pseudopotential method. The variation of the direct and indirect energy gaps with the pressure up to 120 kbar and with the temperature up to 500 K has been done. The calculated fundamental energy gap at different pressures and different temperatures are calculated and compared with the available experimental data which show excellent agreement. The effect of pressure and temperature on the refractive index of the considered materials has also been studied.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 45
- Journal Issue
- 10
- Journal Page Range
- p. 1251-1257
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43094832
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRONIC STRUCTURE; ENERGY GAP; GALLIUM NITRIDES; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; ZINC SULFIDES
- Descriptors DEC
- CHALCOGENIDES; GALLIUM COMPOUNDS; INORGANIC PHOSPHORS; MATERIALS; NITRIDES; NITROGEN COMPOUNDS; OPTICAL PROPERTIES; PHOSPHORS; PHYSICAL PROPERTIES; PNICTIDES; SULFIDES; SULFUR COMPOUNDS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Pleiades Publishing, Ltd.