Published October 2011 | Version v1
Journal article

Effect of pressure and temperature on electronic structure of GaN in the zinc-blende structure

  • 1. Mansoura University, Department of Physics, Faculty of Science (Egypt)

Description

The effect of the hydrostatic pressure and the temperature on the electronic structure in GaN semiconductor has been calculated using the local empirical pseudopotential method. The variation of the direct and indirect energy gaps with the pressure up to 120 kbar and with the temperature up to 500 K has been done. The calculated fundamental energy gap at different pressures and different temperatures are calculated and compared with the available experimental data which show excellent agreement. The effect of pressure and temperature on the refractive index of the considered materials has also been studied.

Additional details

Identifiers

Publishing Information

Journal Title
Semiconductors
Journal Volume
45
Journal Issue
10
Journal Page Range
p. 1251-1257
ISSN
1063-7826
CODEN
SMICES

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43094832
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ELECTRONIC STRUCTURE; ENERGY GAP; GALLIUM NITRIDES; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; ZINC SULFIDES
Descriptors DEC
CHALCOGENIDES; GALLIUM COMPOUNDS; INORGANIC PHOSPHORS; MATERIALS; NITRIDES; NITROGEN COMPOUNDS; OPTICAL PROPERTIES; PHOSPHORS; PHYSICAL PROPERTIES; PNICTIDES; SULFIDES; SULFUR COMPOUNDS; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2011 Pleiades Publishing, Ltd.