Published 1900 | Version v1
Book Metadata-only

Influence of the charge effect on the ion microscopy analysis of insulating minerals

Creators

  • 1. Paris-11 Univ., 91 - Orsay (France)

Description

When an insulating sample on which a conducting grid has been deposited was bombarded with primary ions, the equilibrium potential of the surface was different than that of the reference grid. This charge effect has been studied by ion microscopy employing either a varying magnetic field or the counter-field of the electrostatic mirror

Abstract (French)

Quand on bombarde par des ions primaires un echantillon isolant sur lequel on a depose une grille conductrice, le potentiel de la surface est different de celui de la grille de reference. Cet effet de charge a ete etudie par microscopie ionique soit en faisant varier le champ magnetique ou en utilisant le contre-champ du miroir electrostatique

Additional details

Additional titles

Original title (French)
Influence des effets de charge sur l'analyse des echantillons mineralogiques isolants par emission ionique

Publishing Information

Publisher
GAMS.
Imprint Place
Paris
Imprint Title
18. Colloquium spectroscopicum internationale. Grenoble, 15-19 September 1975
Imprint Pagination
v. 2 p. 590-595.

Conference

Title
18. Colloquium spectroscopicum internationale.
Dates
15 Sep 1975.
Place
Grenoble, France.

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
7250838
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRIC CHARGES; ION MICROPROBE ANALYSIS; MINERALS
Descriptors DEC
CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS