Published 2015 | Version v1
Miscellaneous Restricted

Strain mapping under spherical indentations using transmission Kikuchi diffraction

  • 1. Culham Centre for Fusion Energy, Culham Science Centre, Abingdon, Oxfordshire, OX14 3DB (United Kingdom)
  • 2. University of Oxford, Department of Materials, Parks Road, Oxford, Oxfordshire, OX1 3PH (United Kingdom)
  • 3. Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, Buckinghamshire, HP12 3SE (United Kingdom)

Description

Due to restrictions on both the specimen volumes available and the activity levels research facilities can handle, testing techniques on the micron-scale are very attractive for the study of irradiated material. However, the results of such small tests are convoluted by plasticity size-effects. Spherical nano-indentation is increasingly used to probe irradiated material, but to characterise the area of plastic deformation surrounding indentations a method capable of providing crystallographic information at extremely high spatial resolution is required. Transmission Kikuchi Diffraction (TKD) is a novel diffraction technique that can be performed in a scanning electron microscope. Using this technique, spatial resolutions below 10 nm have been achieved. Initial results, shown here, demonstrate the use of TKD in mapping the lattice rotations caused by indentation produced with a spherical diamond tip. With the addition of strain mapping software the plastic zone size was also evaluated for the first time using diffraction patterns generated via TKD. For a tip of radius 15 μm, inserted into Fe to a strain of 0.07, the plastic zone was observed to extend 1.3 μm to either side of the incident location of indentation and the deformation depth was approximately 0.5 μm. (authors)

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Additional details

Publishing Information

Imprint Pagination
4 p.
Report number
INIS-FR--16-0305

Conference

Title
European Nuclear Young Generation Forum 2015
Acronym
ENYGF 2015
Dates
22-24 Jun 2015
Place
Paris (France)

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
47061095
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DEFORMATION; DIFFRACTION METHODS; ELECTRON DIFFRACTION; MEASURING METHODS; MECHANICAL TESTS; MICROSTRUCTURE; SPATIAL RESOLUTION; STRAINS
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MATERIALS TESTING; RESOLUTION; SCATTERING; TESTING

Optional Information

Notes
16 refs.; Available from the INIS Liaison Officer for France, see the 'INIS contacts' section of the INIS website for current contact and E-mail addresses: http://www.iaea.org/INIS/contacts/