Carbon emission measurements on the RFP device ETA-BETA II
- 1. Istituto Gas Ionizzati del C.N.R., EURATOM-ENEA-CNR Association, Padua (Italy)
Description
The emissivity of the CV 2271 A line has been measured on the RFP device Eta-Beta II along 7 plasma chords, using a 1-m Czerny-Turner spectrometer, equipped with a 2400g/mm grating. The spectrometer has been absolutely calibrated by a strip tungsten lamp to evaluate the carbon content in the discharge. An impurity transport model has been modified to simulate the impurity lines behaviour: for each ion, the ground and metastable state population densities are separately calculated. The simulation of the experimental data cannot account for the asymmetry of the plasma, because the diffusion model is cylindrically symmetric. Therefore, only a qualitative comparison between the calculated ans experimental time behaviour of the emission profiles may be obtained. (author) 2 refs., 6 figs
Additional details
Additional titles
- Augmented title (English)
- RFP (Reversed Field Pinch)
Publishing Information
- Journal Title
- Europhysics Conference Abstracts
- Journal Volume
- 14B
- Series
- Europhys. Conf. Abstr.
- Journal Page Range
- 537-540
- ISSN
- 0378-2271
- CODEN
- ECABD
Conference
- Title
- 17. EPS conference on controlled fusion and plasma heating.
- Dates
- 25-29 Jun 1990.
- Place
- Amsterdam (Netherlands).
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 22032694
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ASYMMETRY; CARBON; DIFFUSION; ELECTRIC CURRENTS; EMISSION; EXCITATION; EXPERIMENTAL DATA; GROUND STATES; METASTABLE STATES; PHOTODIODES; PHOTOMULTIPLIERS; PLASMA IMPURITIES; REVERSE-FIELD PINCH; SPATIAL DISTRIBUTION; SPECTROMETERS; THEORETICAL DATA; TIME DEPENDENCE; TIME RESOLUTION
- Descriptors DEC
- CURRENTS; DATA; DISTRIBUTION; ELEMENTS; ENERGY LEVELS; ENERGY-LEVEL TRANSITIONS; EXCITED STATES; IMPURITIES; INFORMATION; MEASURING INSTRUMENTS; NONMETALS; NUMERICAL DATA; PHOTOTUBES; PINCH EFFECT; RESOLUTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TIMING PROPERTIES