Published 2006 | Version v1
Miscellaneous Metadata-only

Elemental analysis of inks on calligraphy samples from the Qajar dynasty by proton scanning microscope

Creators

  • 1. Atomic Energy Organization of Iran, Van de Graaf Laboratory, Tehran (Iran, Islamic Republic of)
  • 2. Art University, Esfahan, (Iran, Islamic Republic of)
  • 3. Atomic Energy Organization of Iran, Van de Graaf Laboratory, Tehran(Iran, Islamic Republic of)

Description

In this paper we present the results of PIXE analysis performed by scanning micro-beam on calligraphy samples from the Qajar dynasty. The goal of the analysis is to measure the differences in the concentration of various elements inside the ink and the paper. These experiments demonstrate the high efficiency of this method of analysis.

Availability note (English)

Available from Atomic Energy Organization of Iran

Additional details

Additional titles

Original title (Persian)
Analiz-e onsori-e morakab-haye be kar rafte dar dast neveshte-haye dore ghajarie ba estefade az mikroskop-e rubeshi-e proton

Publishing Information

Publisher
The Physical Society of Iran
Imprint Place
Tehran, On (Iran, Islamic Republic of)
Imprint Pagination
[4 p.]

Conference

Title
Annual Physics Conference of Iran
Original Conference Title
Konferanse Phizike Iran
Dates
28-31 Aug 2006
Place
Shahroud (Iran, Islamic Republic of)

INIS

Country of Publication
Iran, Islamic Republic of
Country of Input or Organization
Iran, Islamic Republic of
INIS RN
42106696
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
CONCENTRATION RATIO; CULTURAL OBJECTS; HISTORICAL ASPECTS; INKS; IRAN; LI-DRIFTED SI DETECTORS; MEV RANGE 01-10; MICROANALYSIS; MULTI-ELEMENT ANALYSIS; PAPER; PIXE ANALYSIS; PROTON BEAMS; X-RAY DETECTION
Descriptors DEC
ASIA; BEAMS; CHEMICAL ANALYSIS; DETECTION; DEVELOPING COUNTRIES; DIMENSIONLESS NUMBERS; ENERGY RANGE; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MEV RANGE; MIDDLE EAST; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; X-RAY EMISSION ANALYSIS