Published March 15, 2013
| Version v1
Journal article
Structure and magnetic properties of Co–CeO2 thin films deposited by PLD on Al2O3 (0 0 0 1) substrates
- 1. State Key Laboratory of Electronic Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)
Description
Co–CeO2 films with the stoichiometry of Co0.03Ce0.97CeO2−δ were deposited by pulsed laser deposition (PLD) method on Al2O3 (0 0 0 1) substrate, the structural, magnetic, and magneto-optical properties were investigated. The films show a ceria single phase with (1 1 1) preferred orientation. Magnetic measurements confirm the ferromagnetism at room temperature, which is anisotropic with an out-of-plane magnetization easy axis. Magneto-optical measurements exhibit a giant Faraday rotation of 4800 deg/cm in the direction perpendicular to the film plane
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2012.12.042Additional details
Identifiers
- DOI
- 10.1016/j.physb.2012.12.042;
- PII
- S0921-4526(12)01093-9;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 413
- Journal Page Range
- p. 92-95
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45051759
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; CERIUM OXIDES; COBALT; DEPOSITS; DOPED MATERIALS; ENERGY BEAM DEPOSITION; FARADAY EFFECT; FERROMAGNETISM; GRAIN ORIENTATION; LASER RADIATION; MAGNETIC PROPERTIES; MAGNETIZATION; OPTICAL PROPERTIES; PULSED IRRADIATION; STOICHIOMETRY; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CERIUM COMPOUNDS; CHALCOGENIDES; DEPOSITION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IRRADIATION; MAGNETISM; MATERIALS; METALS; MICROSTRUCTURE; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SURFACE COATING; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.