Published 1972 | Version v1
Book

Simulation of electron-transmission images of crystals containing random and periodic arrays of coherency strain centers

Description

no abstract available

Additional details

Publishing Information

Publisher
Univ. of California Press.
Imprint Place
Berkeley and Los Angeles, CA
Imprint Title
Electron microscopy and structure of materials
Imprint Pagination
p. 163-170.

Conference

Title
5. international materials symposium on the structure and properties of materials-techniques and applications of electron microscopy.
Dates
13 Sep 1971.
Place
Berkeley, California, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
4078784
Subject category
S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTALS; DISLOCATIONS; ELECTRON MICROSCOPY; ORDER PARAMETERS; SIMULATION; STRAINS
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; LINE DEFECTS; MICROSCOPY