Published May 1973
| Version v1
Journal article
An X-ray method for lattice parameters
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Indian J. Pure Appl. Phys.
- Journal Volume
- 11
- Journal Issue
- 5
- Series
- Indian J. Pure Appl. Phys.
- Journal Page Range
- 328-330
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 5118456
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CALIBRATION STANDARDS; CUBIC LATTICES; HEXAGONAL LATTICES; LATTICE PARAMETERS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; SCATTERING
Optional Information
- Notes
- 4 refs.