Novel linear ion trap mass analyzer composed of four planar electrodes
Creators
- 1. Purdue University, Department of Chemistry (United States)
- 2. Justus-Liebig-Universität Giessen, II Physikalisches Institut (Germany)
Description
A novel linear ion trap mass analyzer was developed using just four elongated planar electrodes, mounted in parallel, and employing an RF potential for ion trapping in the radial and axial directions. Mass analysis was achieved using the mass-selective instability scan with ion ejection in the radial direction. The performance of this new device was characterized in comparison with the 6-electrode rectilinear ion trap (RIT) from which it is derived. The 4-electrode trap gives optimum performance in an asymmetric geometry, just like the original optimized 6-electrode RIT. The strong RF fringing fields at the ends of the RF rods account for axial ion trapping without use of extra electrodes or an axial DC voltage. Field calculations and simulations have been carried out to study the trapping potential inside RITs with various configurations. Demonstrated capabilities include analysis of externally injected ions with mass resolution in excess of 1000 and a mass/charge range of 650 Th as well as tandem mass spectrometry capabilities. The geometric simplicity and performance characteristics of the 4-electrode RIT make it particularly attractive in the development of next generation miniaturized mass spectrometers.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of the American Society for Mass Spectrometry
- Journal Volume
- 17
- Journal Issue
- 4
- Journal Page Range
- p. 631-639
- ISSN
- 1044-0305
- CODEN
- JAMSEF
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50017271
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; ELECTRIC POTENTIAL; EQUIPMENT; INSTABILITY; IONS; MASS; MASS RESOLUTION; MASS SPECTROMETERS; MASS SPECTROSCOPY; SIMULATION; TRAPS
- Descriptors DEC
- CHARGED PARTICLES; EVALUATION; MEASURING INSTRUMENTS; RESOLUTION; SPECTROMETERS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2006 American Society for Mass Spectrometry