Published May 1999 | Version v1
Journal article

Metal ion and oxygen vacancies in bulk and thin film La1-xSrxCoO3

  • 1. Department of Materials Science and Nuclear Engineering, University of Maryland, College Park, Maryland 20742 (United States)
  • 2. Division of Materials Science, Brookhaven National Laboratory, Upton, New York 11973 (United States)
  • 3. Carnegie Laboratory of Physics, University of Dundee, Dundee DD1 4HN (United Kingdom)
  • 4. Army Research Laboratory, Adelphi, Maryland 20783 (United States)
  • 5. Centre for Electrophotonic Materials and Devices, Department of Engineering Physics, McMaster University, Hamilton, Ontario, L8S 4L7 (CANADA)

Description

Positron-lifetime and depth-resolved Doppler-broadening spectroscopy were used to investigate vacancies formed in bulk and laser ablated thin film La1-xSrxCoO3. In bulk samples, metal ion vacancies, which are most likely situated in the La sublattice, show a lifetime of 219 ps and a Doppler-broadening S parameter 1.06 times higher than the bulk. The metal-ion vacancy concentration increases with increasing Sr content. For x≥0.3, oxygen vacancies are detected, yielding a positron lifetime of 149 ps, only 10 ps longer than the bulk lifetime; the S parameter is 4% higher than for the bulk. For a given Sr concentration the films show a higher defect density than the bulk samples. The introduction of oxygen vacancy related defects is observed for increasing Sr doping concentration for both film and bulk samples. In films these defects probably consist of larger clusters and/or form complexes with metal ion vacancies. copyright 1999 The American Physical Society

Additional details

Publishing Information

Journal Title
Physical Review. B, Condensed Matter
Journal Volume
59
Journal Issue
20
Journal Page Range
p. 13365-13369
ISSN
0163-1829
CODEN
PRBMDO