Highly stable carbon nanotube field emitters on small metal tips against electrical arcing for miniature X-ray tubes
- 1. Korea Advanced Institute of Science and Technology Daejeon (Korea, Republic of)
Description
If CNT emitters are operated at a high voltage or at a high electric field, electrical arcing (or vacuum breakdown) can occur. Arcing can be initiated by the removed CNTs, impurities on the CNTs or substrates, protrusion of CNTs, low operating vacuum, and a very high electric field. Since arcing is accompanied with a very high current flow and it can produce plasma channel near the emitter, CNTs are seriously damaged or sometimes CNTs are almost completely removed from the substrate by the arcing events. Detachment of CNTs from a substrate is an irreversible catastrophic phenomenon for a device operation. In addition to the detachment of CNTs, arcing induces a sudden voltage drop and thus device operation is stopped. The metal mixture strongly attached CNTs to the tip substrate. Due to the strong adhesion, CNT emitters could be pre-treated with electrical conditioning process without seriously damaging the CNTs even though many intense arcing events were induced at the small and sharp geometry of the tip substrate. Impurities that were loosely bound to the substrates were almost removed and CNTs heights became uniform after the electrical conditioning process
Additional details
Publishing Information
- Publisher
- KNS
- Imprint Place
- Daejeon (Korea, Republic of)
- Imprint Title
- Proceedings of the KNS 2015 spring meeting
- Imprint Pagination
- [1 CD-ROM]
- Journal Page Range
- [6 p.]
Conference
- Title
- 2015 spring meeting of the KNS
- Dates
- 6-8 May 2015
- Place
- Jeju (Korea, Republic of)
INIS
- Country of Publication
- Korea, Republic of
- Country of Input or Organization
- Korea, Republic of
- INIS RN
- 47023439
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ADHESION; BREAKDOWN; DAMAGE; ELECTRIC FIELDS; GEOMETRY; IMPURITIES; NANOTUBES; X-RAY TUBES
- Descriptors DEC
- ELECTRON TUBES; EQUIPMENT; MATHEMATICS; NANOSTRUCTURES; X-RAY EQUIPMENT
Optional Information
- Notes
- 31 refs, 8 figs