Published May 2006 | Version v1
Journal article

Influence of the Nb middle layer on the current of a double Josephson junction

  • 1. Faculty of Engineering, Kanagawa University (Japan)

Description

We have investigated the relation between the Josephson current and the thickness of the Nb middle layer in a double Josephson junction. The characteristics of the sample are somewhat different even though the sample is made under the same conditions. So we have changed only the thickness of the Nb middle layer in the double Josephson junction in the same substrate with the shutter between the sample and the target. We fabricated the double Josephson junction completely under the same conditions except for the thickness of the Nb middle layer. The Josephson current increased as the Nb middle layer became thinner. However, no Josephson current was observed without an Nb middle layer

Availability note (English)

Available online at http://stacks.iop.org/0953-2048/19/S217/sust6_5_S11.pdf or at the Web site for the journal Superconductor Science and Technology (ISSN 1361-6668) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Superconductor Science and Technology
Journal Volume
19
Journal Issue
5
Journal Page Range
p. S217-S220
ISSN
0953-2048
CODEN
SUSTEF

Conference

Title
10. international superconductive electronics conference
Acronym
ISEC 2005
Dates
5-9 Sep 2005
Place
Noordwijkerhout (Netherlands)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37085138
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
JOSEPHSON JUNCTIONS; LAYERS; NIOBIUM; SUPERCONDUCTORS; THICKNESS
Descriptors DEC
DIMENSIONS; ELEMENTS; METALS; REFRACTORY METALS; SUPERCONDUCTING JUNCTIONS; TRANSITION ELEMENTS