Published January 2014
| Version v1
Journal article
Radiation-hardened-by-design clocking circuits in 0.13-μm CMOS technology
Description
We present a single-event-hardened phase-locked loop for frequency generation applications and a digital delay-locked loop for DDR2 memory interface applications. The PLL covers a 12.5 MHz to 500 MHz frequency range with an RMS Jitter (RJ) of 4.70-pS. The DLL operates at 267 MHz and has a phase resolution of 60-pS. Designed in 0.13-μm CMOS technology, the PLL and the DLL are hardened against SEE for charge injection of 250 fC. The PLL and the DLL consume 17 mW and 22 mW of power under a 1.5 V power supply, respectively
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/9/01/C01029Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 9
- Journal Issue
- 01
- Journal Page Range
- p. C01029
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46055443
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AVAILABILITY; DESIGN; MHZ RANGE; RADIATION HARDNESS; RESOLUTION
- Descriptors DEC
- FREQUENCY RANGE