Published July 16, 2007 | Version v1
Journal article

Electronic and atomic structure of Ge2Sb2Te5 phase change memory material

  • 1. Engineering Department, Cambridge University, Cambridge CB2 1PZ (United Kingdom)

Description

Electronic structure calculations are presented for various model structures of the crystalline and amorphous phases of Ge2Sb2Te5. The structures are all found to possess a band gap of order 0.5 eV, indicating closed shell behaviour. It is pointed out that structural vacancies in A7-like Ge2Sb2Te5 are not electronically active. In addition, A7-like structures do not support valence alternation pair defects, which are one model of the conduction processes in the amorphous phase in non-volatile memories

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2006.11.159

Additional details

Identifiers

DOI
10.1016/j.tsf.2006.11.159;
PII
S0040-6090(06)01497-0;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
19
Journal Page Range
p. 7538-7541
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
Symposium I on thin films for large area electronics EMRS 2007 conference
Acronym
EMRS 2006 - Symposium J
Dates
29 May - 2 Jun 2006
Place
Nice (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39069089
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AMORPHOUS STATE; ANTIMONY COMPOUNDS; DEFECTS; ELECTRONIC STRUCTURE; GERMANIDES; PHASE TRANSFORMATIONS; TELLURIDES; VACANCIES; VOLATILITY
Descriptors DEC
CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; GERMANIUM COMPOUNDS; POINT DEFECTS; TELLURIUM COMPOUNDS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.