Published July 16, 2007
| Version v1
Journal article
Electronic and atomic structure of Ge2Sb2Te5 phase change memory material
Creators
- 1. Engineering Department, Cambridge University, Cambridge CB2 1PZ (United Kingdom)
Description
Electronic structure calculations are presented for various model structures of the crystalline and amorphous phases of Ge2Sb2Te5. The structures are all found to possess a band gap of order 0.5 eV, indicating closed shell behaviour. It is pointed out that structural vacancies in A7-like Ge2Sb2Te5 are not electronically active. In addition, A7-like structures do not support valence alternation pair defects, which are one model of the conduction processes in the amorphous phase in non-volatile memories
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2006.11.159Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.11.159;
- PII
- S0040-6090(06)01497-0;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 19
- Journal Page Range
- p. 7538-7541
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- Symposium I on thin films for large area electronics EMRS 2007 conference
- Acronym
- EMRS 2006 - Symposium J
- Dates
- 29 May - 2 Jun 2006
- Place
- Nice (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39069089
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; ANTIMONY COMPOUNDS; DEFECTS; ELECTRONIC STRUCTURE; GERMANIDES; PHASE TRANSFORMATIONS; TELLURIDES; VACANCIES; VOLATILITY
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; GERMANIUM COMPOUNDS; POINT DEFECTS; TELLURIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.