Published October 12, 2015 | Version v1
Journal article Metadata-only

DIY Tomography sample holder

Creators

  • 1. The York-JEOL Nanocentre and Physics Department, The University of York, Heslington, YO10 5DD, York (United Kingdom)

Description

A very simple tomography sample holder at minimal cost was developed in-house. The holder is based on a JEOL single tilt fast exchange sample holder where its exchangeable tip was modified to allow high angle degree tilt. The shape of the tip was designed to retain mechanical stability while minimising the lateral size of the tip. The sample can be mounted on as for a standard 3mm Cu grids as well as semi-circular grids from FIB sample preparation. Applications of the holder on different sample systems are shown. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/644/1/012013

Additional details

Identifiers

DOI
10.1088/1742-6596/644/1/012013;

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
644
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
Electron Microscopy and Analysis Group conference
Acronym
EMAG2015
Dates
29 Jun - 2 Jul 2015
Place
Manchester (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47108091
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COPPER; DESIGN; GRIDS; SAMPLE HOLDERS; SAMPLE PREPARATION; STABILITY; TOMOGRAPHY
Descriptors DEC
DIAGNOSTIC TECHNIQUES; ELECTRODES; ELEMENTS; METALS; TRANSITION ELEMENTS