Published May 1, 2008 | Version v1
Journal article

Towards a fitting procedure for deeply virtual Compton scattering at next-to-leading order and beyond

  • 1. Institut fuer Theoretische Physik, Universitaet Regensburg, D-93040 Regensburg (Germany)
  • 2. Department of Physics, Faculty of Science, University of Zagreb, PO Box 331, HR-10002 Zagreb (Croatia)
  • 3. Institut fuer Theoretische Physik II, Ruhr-Universitaet Bochum, D-44780 Bochum (Germany)
  • 4. Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287-1504 (United States)
  • 5. Theoretical Physics Division, Rudjer Boskovic Institute, PO Box 180, HR-10002 Zagreb (Croatia)

Description

Combining dispersion and operator product expansion techniques, we derive the conformal partial wave decomposition of the virtual Compton scattering amplitude in terms of complex conformal spin to twist-two accuracy. The perturbation theory predictions for the deeply virtual Compton scattering (DVCS) amplitude are presented in next-to-leading order for both conformal and modified minimal subtraction scheme. Within a conformal subtraction scheme, where we exploit predictive power of conformal symmetry, the radiative corrections are presented up to next-to-next-to-leading order accuracy. Here, because of the trace anomaly, the mixing of conformal moments of generalized parton distributions (GPD) at the three-loop level remains unknown. Within a new proposed parameterization for GPDs, we then study the convergence of perturbation theory and demonstrate that our formalism is suitable for a fitting procedure of DVCS observables

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nuclphysb.2007.10.029

Additional details

Identifiers

DOI
10.1016/j.nuclphysb.2007.10.029;
arXiv
arXiv:hep-ph/0703179v2;
PII
S0550-3213(07)00870-X;

Publishing Information

Journal Title
Nuclear Physics. B
Journal Volume
794
Journal Issue
1-2
Journal Page Range
p. 244-323
ISSN
0550-3213
CODEN
NUPBBO

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.