Published October 2009 | Version v1
Journal article

Basics of spectroscopic instruments. X-ray fluorescence spectrometer, X-ray absorption spectrometer, and X-ray photoelectron spectrometer

  • 1. Rigaku Corp., Takatsuki, Osaka (Japan)
  • 2. Rigaku Corp., Akishima, Tokyo (Japan)
  • 3. ULVAC-PHI, Incorporated, Chigasaki, Kanagawa (Japan)

Description

Basics of x-ray fluorescence spectrometer, x-ray absorption spectrometer, and x-ray photoelectron spectrometer are reviewed. X-ray fluorescence spectrometry and x-ray absorption spectroscopy are non-destructive and bulk-sensitive techniques of elemental and chemical-state analyses, respectively. X-ray photoelectron spectroscopy is generally employed for characterizing surfaces and/or adsorbents of solid materials. The composition and each element of these spectroscopic devices are described, and qualitative and quantitative analytical procedures are explained using recent examples. (author)

Additional details

Publishing Information

Journal Title
Bunko Kenkyu
Journal Volume
58
Journal Issue
5
Journal Page Range
p. 224-239
ISSN
0038-7002

Optional Information

Notes
32 refs., 27 figs., 2 tabs.