Published March 11, 2009
| Version v1
Journal article
Verification of the FEFF simulations to K-edge XANES spectra of the third row elements
Creators
- 1. SR Center, Ritsumeikan University, 1-1-1 Noji-Higashi, Kusatsu, Shiga 525-8577 (Japan)
Description
Availability of the FEFF simulations to K-edge x-ray absorption near-edge structure (XANES) spectra of the third row elements has been investigated. The FEFF simulations reproduce the spectra from simple substances (Al, Mg, Si, P and S) well, but do not always reproduce those from chemical compounds containing the third row elements. The FEFF simulation has a tendency to underestimate the white line intensity of the XANES spectra in these compounds. This situation is much improved by the Z+1 approach, in which the central atom is replaced by an atom with the atomic number larger by one.
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-8984/21/10/104214Additional details
Identifiers
- DOI
- 10.1088/0953-8984/21/10/104214;
- PII
- S0953-8984(09)92419-5;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 21
- Journal Issue
- 10
- Journal Page Range
- [6 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
Conference
- Title
- 1. international workshop on the theoretical calculation of ELNES and XANES
- Acronym
- TEX2008
- Dates
- 2-4 Jul 2008
- Place
- Nagoya (Japan)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41012777
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ABSORPTION SPECTROSCOPY; ALUMINIUM; ATOMIC NUMBER; ATOMS; MAGNESIUM; PHOSPHORUS; SILICON; SIMULATION; SPECTRA; SULFUR; VERIFICATION; X RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKALINE EARTH METALS; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; NONMETALS; RADIATIONS; SEMIMETALS; SORPTION; SPECTROSCOPY