Published June 1992
| Version v1
Journal article
A hardened technology on SOI for analog devices
- 1. CEA, CentER d'Etudes de Bruyeres-Le-Chatel, BP12, 91680 Bruyeres-Le-Chatel (France)
Description
This paper is dedicated to the presentation of a hardened and mixed analog-digital technology under development. This technology now includes a PJFET with a quite good hardness, CMOS transistors with a potential multi-Megarad hardness and first tests of bipolar transistors with a not yet optimized structure (structure of the JFET). All the results achieved so far, together with the optimizations under way will lead to an analog technology with a digital capability and a high level of hardness (neutron fluence, cumulated dose, immunity to upsets) to address the needs of military applications and electronics for the elementary particles physics detectors of the next generation colliders
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 39
- Journal Issue
- 3
- Journal Page Range
- p. 387-390.
- ISSN
- 0018-9499
- CODEN
- IETNAE
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24002704
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANALOG SYSTEMS; DOSE RATES; ELECTRICAL INSULATORS; ELEMENTARY PARTICLES; NEUTRON FLUENCE; OPTIMIZATION; RADIATION DETECTORS; RADIATION HARDENING; SILICON; TECHNOLOGY ASSESSMENT
- Descriptors DEC
- ELECTRICAL EQUIPMENT; ELEMENTS; EQUIPMENT; HARDENING; MEASURING INSTRUMENTS; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; SEMIMETALS